The AD5551 and AD5552 are single, 14-bit, serial input, voltage output DACs that operate from a single 5 V ± 10% supply.
The AD5551 and AD5552 utilize a versatile 3-wire interface that is compatible with SPI, QSPI, MICROWIRE, and DSP interface standards.
These DACs provide 14-bit performance without any adjustments. The DAC output is unbuffered, which reduces power consumption and offset errors contributed by an output buffer. With an external op amp the AD5552 can be operated in bipolar mode generating a ±VREF output swing. The AD5552 also includes Kelvin sense connections for the reference and analog ground pins to reduce layout sensitivity. For higher precision applications, please refer to 16-bit DACs AD5541, AD5542, and AD5544.
The AD5551 and AD5552 are available in an SO package.
VDD to AGND . . . . . . . . . . . . . . . . . . . . . . . . 0.3 V to +6 V
Digital Input Voltage to DGND . . . . . . 0.3 V to VDD + 0.3 V
VOUT to AGND . . . . . . . . . . . . . . . . . . 0.3 V to VDD + 0.3 V
AGND, AGNDF, AGNDS to DGND . . . .. .. . . . 0.3 V to +0.3 V
Input Current to Any Pin Except Supplies . . . . . . . . ±10 mA
Operating Temperature Range
Industrial (B Version) . . . . . . . . . . . . . . . 40°C to +85°C
Storage Temperature Range . . . . . . . . 65°C to +150°C
Maximum Junction Temperature, (T J max) . . . . .. . . . 150°C
Package Power Dissipation . . . . . . . . . . . (T J max TA)/JA
Thermal Impedance JA
SOIC (SO-8) . . . . . . . . . . . . . . . . . . . . . .. . . . .. . 149.5°C/W
SOIC (R-14) . . . . . . . . . . . . . . . . . . . . . . . . . . . . 104.5°C/W
Lead Temperature, Soldering
Vapor Phase (60 sec) . . . . . . . . . . . . . . . . . . . . . .. . . 215°C
Infrared (15 sec) . . . . . . . . . . . . . . . . . . . . . . . . .. . . 220°C
*Stresses above those listed under Absolute Maximum Ratings may cause permanent damage to the device. This is a stress rating only; functional operation of the device at these or any other conditions above those listed in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability.
Required Field 
